Methodology for the simulation of the variability of MOSFETs with polycrystalline high-k dielectrics using CAFM input data

1. Ruiz, A.
2. Couso, C.
3. Seoane, N.
4. Porti, M.
5. Garcia-Loureiro, A.
6. Nafria, M.

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DOI: 10.1109/ACCESS.2021.3090472 GOOGLE SCHOLAR lock_openOpen access editor

Data source: Scopus