Neutron induced single event upset dependence on bias voltage for CMOS SRAM with BPSG

  1. Vazquez-Luque, A.
  2. Marin, J.
  3. Terron, J.A.
  4. Pombar, M.
  5. Bedogni, R.
  6. Sanchez-Doblado, F.
  7. Gomez, F.
Journal:
IEEE Transactions on Nuclear Science

ISSN: 0018-9499

Year of publication: 2013

Volume: 60

Issue: 6

Pages: 4692-4696

Type: Article

DOI: 10.1109/TNS.2013.2283532 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus