Publicacións nas que colabora con ENRIQUE COMESAÑA FIGUEROA (10)

2024

  1. A General Toolkit for Advanced Semiconductor Transistors: From Simulation to Machine Learning

    IEEE Journal of the Electron Devices Society

2023

  1. A comprehensive Pelgrom-based on-current variability model for FinFET, NWFET and NSFET

    Solid-State Electronics, Vol. 199

  2. A machine learning approach to model the impact of line edge roughness on gate-all-around nanowire FETs while reducing the carbon footprint

    PLoS ONE, Vol. 18, Núm. 7 JULY

  3. An accurate machine learning model to study the impact of realistic metal grain granularity on Nanosheet FETs

    Solid-State Electronics, Vol. 207

  4. Figures of merit that characterize silicon gate-all-around nanowire FETs affected by line edge roughness variability

    Zenodo

  5. Figures of merit that characterize silicon gate-all-around nanowire FETs affected by line edge roughness variability

    Zenodo

  6. Optimization of thermionic cooling semiconductor heterostructures with deep learning techniques

    International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

2022

  1. Pelgrom-Based Predictive Model to Estimate Metal Grain Granularity and Line Edge Roughness in Advanced Multigate MOSFETs

    IEEE Journal of the Electron Devices Society, Vol. 10, pp. 953-959

2021

  1. Impact of metal grain granularity on three gate-all-around advanced architectures

    International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

  2. Simulations of statistical variability in n-Type FinFET, nanowire, and nanosheet FETs

    IEEE Electron Device Letters, Vol. 42, Núm. 10, pp. 1416-1419