Analysis of Fluctuation Sensitivity Map Algorithms Applied to a 10nm GAA NW FET

  1. Andrés, P.
  2. Seoane, N.
  3. García-Loureiro, A.J.
  4. Indalecio, G.
Proceedings:
Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018

ISBN: 9781538657799

Year of publication: 2018

Type: Conference paper

DOI: 10.1109/CDE.2018.8597155 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus