Variability characterisation of nanoscale Si and InGaAs fin field-effect-transistors at subthreshold
ISSN: 1546-2005, 1546-1998
Year of publication: 2015
Volume: 11
Issue: 2
Pages: 256-262
Type: Article
ISSN: 1546-2005, 1546-1998
Year of publication: 2015
Volume: 11
Issue: 2
Pages: 256-262
Type: Article