Experimental characterization of peripheral photocurrent in CMOS photodiodes down to 65 nm technology

  1. Blanco-Filgueira, B.
  2. López, P.
  3. Roldán, J.B.
Journal:
Semiconductor Science and Technology

ISSN: 0268-1242,  1361-6641

Year of publication: 2013

Volume: 28

Issue: 4

Type: Article

DOI: 10.1088/0268-1242/28/4/045011 GOOGLE SCHOLAR
Data source: Scopus