Impact of intrinsic parameter fluctuations on the performance of HEMTs studied with a 3D parallel drift-diffusion simulator

  1. Seoane, N.
  2. García-Loureiro, A.J.
  3. Kalna, K.
  4. Asenov, A.
Journal:
Solid-State Electronics

ISSN: 0038-1101

Year of publication: 2007

Volume: 51

Issue: 3

Pages: 481-488

Type: Article

DOI: 10.1016/J.SSE.2007.01.030 GOOGLE SCHOLAR

Sustainable development goals

Data source: Scopus