MARIA ELENA
LOPEZ LAGO
Catedrática de universidade


Centre National de la Recherche Scientifique
París, FranciaPublicacións en colaboración con investigadores/as de Centre National de la Recherche Scientifique (3)
2000
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Third order nonlinearity characterization of optical wave-guides
INTEGRATED OPTICS DEVICES IV
1999
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Dispersion-scan method for the measurement of nonlinear refraction and absorption of waveguides
Optics InfoBase Conference Papers
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Dispersive-scan measurement of the fast component of the third-order nonlinearity of bulk materials and waveguides
Optics Letters, Vol. 24, Núm. 19, pp. 1361-1363