Roughness measurement by speckle correlation interferometer with a phase shifting by geometrical phase control
- Daniel Gallego 1
- Oscar López 1
- M.C. Nistal 1
- Vicente Moreno 1
- 1 Area of Optics. Department of Applied Physics. Universidade de Santiago de Compostela
- A. Méndez Vilas (dir.)
Editorial: Elsevier
ISBN: 978-0-08-044648-6
Ano de publicación: 2005
Páxinas: 343-349
Congreso: International Meeting on Applied Physics (1. 2005. Badajoz)
Tipo: Achega congreso