Validation of a GEANT4 simulation model for pinhole SPECT including calibration parameters
- Aguiar, Pablo
- Pino, Francisco
- Ros, Domenec
- El Bitar, Ziad
ISSN: 1095-7863
ISBN: 978-1-4673-0120-6
Ano de publicación: 2011
Páxinas: 2827-2828
Congreso: IEEE Nuclear Science Symposium/Medical Imaging Conference (NSS/MIC)/18th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors
Tipo: Achega congreso