Benchmarking of FinFET, Nanosheet, and Nanowire FET Architectures for Future Technology Nodes
- Nagy, D.
- Espineira, G.
- Indalecio, G.
- Garcia-Loureiro, A.J.
- Kalna, K.
- Seoane, N.
Journal:
IEEE Access
ISSN: 2169-3536
Year of publication: 2020
Volume: 8
Pages: 53196-53202
Type: Article