Fluctuation Sensitivity Map: A Novel Technique to Characterise and Predict Device Behaviour Under Metal Grain Work-Function Variability Effects

  1. Indalecio, G.
  2. Seoane, N.
  3. Kalna, K.
  4. Garcia-Loureiro, A.J.
Journal:
IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year of publication: 2017

Volume: 64

Issue: 4

Pages: 1695-1701

Type: Article

DOI: 10.1109/TED.2017.2670060 GOOGLE SCHOLAR
Data source: Scopus