Influence of device geometry on electrical characteristics of a 10.7 nm SOI-FinFET

  1. Abdikarimov, A.
  2. Indalecio, G.
  3. Comesana, E.
  4. Garcia-Loureiro, A.J.
  5. Seoane, N.
  6. Kalna, K.
  7. Atamuratov, A.E.
Actas:
2014 International Workshop on Computational Electronics, IWCE 2014

ISBN: 9781479954339

Ano de publicación: 2014

Tipo: Achega congreso

DOI: 10.1109/IWCE.2014.6865877 GOOGLE SCHOLAR