Characterization of the neutron induced single event upset in SRAM around high megavoltage clinical accelerators
- Jiménez-Ortega, E.
- Expósito, M.R.
- González-Soto, X.
- Terrón, J.A.
- Gómez, F.
- Sánchez-Doblado, F.
Actas:
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
ISBN: 9781457705878
Ano de publicación: 2011
Páxinas: 922-925
Tipo: Achega congreso