Refractive-index profiling of planar gradient-index waveguides by phase-measuring microinterferometry

  1. Sochacka, M.
  2. Lago, E.L.
  3. Jaroszewicz, Z.
Journal:
Applied Optics

ISSN: 2155-3165,  1559-128X

Year of publication: 1994

Volume: 33

Issue: 16

Pages: 3342-3347

Type: Article

DOI: 10.1364/AO.33.003342 GOOGLE SCHOLAR
Data source: Scopus