Testing two techniques for wavefront analysisSpecific applications and comparative study

  1. S. Vallmitjana 1
  2. A. Marzoa 1
  3. S. Bosch 1
  4. E. Acosta 2
  1. 1 Departament de Física Aplicada, Facultat de Física, Universidad de Barcelona
  2. 2 Departamento de Física Aplicada, Universidade de Santiago de Compostela, Facultade de Óptica e Optometrí
Zeitschrift:
Óptica pura y aplicada

ISSN: 2171-8814

Datum der Publikation: 2017

Ausgabe: 50

Nummer: 4

Seiten: 327-335

Art: Artikel

DOI: 10.7149/OPA.50.4.49022 DIALNET GOOGLE SCHOLAR lock_openOpen Access editor

Andere Publikationen in: Óptica pura y aplicada

Zusammenfassung

This work focuses on the description of two different techniques for characterizing wavefronts: by using Shack-Hartmann (SH) sensor and by using Point Diffraction Interferometer (PDI). Moreover describes application examples of each in recent research, and finally a comparative study of both techniques on a single optical system is performed.

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Informationen zur Finanzierung

This work was supported by the “Agencia Estatal de Investigación” (AEI) and the “Fondo Europeo de Desarrollo Regional” (FEDER), under Project FIS ?? -7? 73? 19-C2-2-R of the Spanish “Ministerio de Economía, Industria y Competitividad”.

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Fuente de los datos: Dialnet