Datos de investigación
Investigador/a: JUAN CARLOS PICHEL CAMPOS
4 datos de investigación referenciados
Datos de investigación referenciados por JUAN CARLOS PICHEL CAMPOS.
2024
2023
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Figures of merit that characterize silicon gate-all-around nanowire FETs affected by line edge roughness variability
Zenodo
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Figures of merit that characterize silicon gate-all-around nanowire FETs affected by line edge roughness variability
Zenodo
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Supporting data for "BigSeqKit: a parallel Big Data toolkit to process FASTA and FASTQ files at scale"
GigaScience Database