
ANTONIO JESUS
GARCIA LOUREIRO
Catedrático de universidade
Publicacións (16) Publicacións de ANTONIO JESUS GARCIA LOUREIRO Ver datos de investigación referenciados.
2014
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Quantum corrections based on the 2-D Schrödinger equation for 3-D finite element monte carlo simulations of nanoscaled finfets
IEEE Transactions on Electron Devices, Vol. 61, Núm. 2, pp. 423-429
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Statistical study of the influence of LER and MGG in SOI MOSFET
Semiconductor Science and Technology, Vol. 29, Núm. 4
2013
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Simulation of the spin polarization and the charge transport in Zener tunnel junctions based on ferromagnetic GaAs and ZnO
Computer Physics Communications, Vol. 184, Núm. 3, pp. 746-756
2012
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3D 'atomistic' simulations of dopant induced variability in nanoscale implant free In 0.75Ga 0.25As MOSFETs
Solid-State Electronics, Vol. 69, pp. 43-49
2011
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Multi-Subband Ensemble Monte Carlo simulation of bulk MOSFETs for the 32 nm-node and beyond
Solid-State Electronics, Vol. 65-66, Núm. 1, pp. 88-93
2010
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Reduction of the self-forces in Monte Carlo simulations of semiconductor devices on unstructured meshes
Computer Physics Communications, Vol. 181, Núm. 1, pp. 24-34
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Simulation of the tunnelling transport in ferromagnetic GaAs/ZnO heterojunctions
Journal of Physics: Conference Series
2009
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3D drift-diffusion simulation with quantum-corrections of Tri-Gate MOSFETs
Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09
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Impact of intrinsic parameter fluctuations on the performance of In 0.75Ga0.25As implant free MOSFETs
Semiconductor Science and Technology, Vol. 24, Núm. 5
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Numerical simulation of a ferromagnetic spin-polarised diode
Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09
2008
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Atomistic mesh generation for the simulation of nanoscale metal-oxide-semiconductor field-effect transistors
Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, Vol. 77, Núm. 5
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Benchmarking of scaled InGaAs implant-free NanoMOSFETs
IEEE Transactions on Electron Devices, Vol. 55, Núm. 9, pp. 2297-2306
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Development of a 3D parallel finite element Monte Carlo simulator for nano-MOSFETs
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
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Random dopant related variability in the 30 nm gate length In0.75Ga0.25As implant free MOSFET
Journal of Computational Electronics, Vol. 7, Núm. 3, pp. 159-163
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Tetrahedral elements in self-consistent parallel 3D Monte Carlo simulations of MOSFETs
Journal of Computational Electronics, Vol. 7, Núm. 3, pp. 201-204
2006
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Study of fluctuations in advanced MOSFETs using a 3D finite element parallel simulator
Journal of Computational Electronics, Vol. 5, Núm. 4, pp. 311-314