
ANTONIO JESUS
GARCIA LOUREIRO
Catedrático de universidade
Publicacións (116) Publicacións de ANTONIO JESUS GARCIA LOUREIRO Ver datos de investigación referenciados.
2024
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A General Toolkit for Advanced Semiconductor Transistors: From Simulation to Machine Learning
IEEE Journal of the Electron Devices Society, Vol. 12, pp. 1057-1064
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A novel machine learning workflow to optimize cooling devices grounded in solid-state physics
Scientific Reports, Vol. 14, Núm. 1
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Comprehensive study on the physical properties of CuO-ZnO thin films: Insights into solar cell simulation
Optical Materials, Vol. 155
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First investigation into the physical characteristics of GO-Doped CuO-ZnO thin films as a secondary absorption layer in CIGS solar cells
Materials Letters, Vol. 357
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Scaling Challenges of Nanosheet Field-Effect Transistors into Sub-2 nm Nodes
IEEE Journal of the Electron Devices Society, Vol. 12, pp. 479-485
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Ultra Scaled Nanosheet & Nanowire FETs Performance Evaluation with 3D Monte Carlo Simulations for Future Technology
Proceedings of the International Semiconductor Conference, CAS
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Wide-bandgap III-V materials for high efficiency air and underwater optical photovoltaic power transmission
Solar Energy Materials and Solar Cells, Vol. 266
2023
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A comprehensive Pelgrom-based on-current variability model for FinFET, NWFET and NSFET
Solid-State Electronics, Vol. 199
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A machine learning approach to model the impact of line edge roughness on gate-all-around nanowire FETs while reducing the carbon footprint
PLoS ONE, Vol. 18, Núm. 7 JULY
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An accurate machine learning model to study the impact of realistic metal grain granularity on Nanosheet FETs
Solid-State Electronics, Vol. 207
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Optimization of thermionic cooling semiconductor heterostructures with deep learning techniques
International Conference on Simulation of Semiconductor Processes and Devices, SISPAD
2022
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Band-gap material selection for remote high-power laser transmission
Solar Energy Materials and Solar Cells, Vol. 235
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Multilevel 3-D Device Simulation Approach Applied to Deeply Scaled Nanowire Field Effect Transistors
IEEE Transactions on Electron Devices, Vol. 69, Núm. 9, pp. 5276-5282
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Parallel approach of Schrödinger-based quantum corrections for ultrascaled semiconductor devices
Journal of Computational Electronics, Vol. 21, Núm. 1, pp. 10-20
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Pelgrom-Based Predictive Model to Estimate Metal Grain Granularity and Line Edge Roughness in Advanced Multigate MOSFETs
IEEE Journal of the Electron Devices Society, Vol. 10, pp. 953-959
2021
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Does the Threshold Voltage Extraction Method Affect Device Variability?
IEEE Journal of the Electron Devices Society, Vol. 9, pp. 469-475
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Impact of metal grain granularity on three gate-all-around advanced architectures
International Conference on Simulation of Semiconductor Processes and Devices, SISPAD
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Methodology for the Simulation of the Variability of MOSFETs with Polycrystalline High-k Dielectrics Using CAFM Input Data
IEEE Access, Vol. 9, pp. 90568-90576
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Methodology for the simulation of the variability of MOSFETs with polycrystalline high-k dielectrics using CAFM input data
IEEE Access
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Simulations of statistical variability in n-Type FinFET, nanowire, and nanosheet FETs
IEEE Electron Device Letters, Vol. 42, Núm. 10, pp. 1416-1419