Publicacións (18) Publicacións nas que participase algún/ha investigador/a Ver datos de investigación referenciados.

filter_list Mechanics of Materials

2009

  1. 3D drift-diffusion simulation with quantum-corrections of Tri-Gate MOSFETs

    Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09

  2. A comparison between a fully-3D real-space versus coupled mode-space NEGF in the study of variability in gate-all-around Si nanowire MOSFET

    International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

  3. Impact of intrinsic parameter fluctuations on the performance of In 0.75Ga0.25As implant free MOSFETs

    Semiconductor Science and Technology, Vol. 24, Núm. 5

  4. Investigation of resistance in n-doped Si wires using NEGF formalism

    Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09

  5. Numerical simulation of a ferromagnetic spin-polarised diode

    Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09

2008

  1. Atomistic mesh generation for the simulation of nanoscale metal-oxide-semiconductor field-effect transistors

    Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, Vol. 77, Núm. 5

  2. Benchmarking of scaled InGaAs implant-free NanoMOSFETs

    IEEE Transactions on Electron Devices, Vol. 55, Núm. 9, pp. 2297-2306

  3. Development of a 3D parallel finite element Monte Carlo simulator for nano-MOSFETs

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

  4. Random dopant related variability in the 30 nm gate length In0.75Ga0.25As implant free MOSFET

    Journal of Computational Electronics, Vol. 7, Núm. 3, pp. 159-163

  5. Tetrahedral elements in self-consistent parallel 3D Monte Carlo simulations of MOSFETs

    Journal of Computational Electronics, Vol. 7, Núm. 3, pp. 201-204

2006

  1. Study of fluctuations in advanced MOSFETs using a 3D finite element parallel simulator

    Journal of Computational Electronics, Vol. 5, Núm. 4, pp. 311-314